Wafer-Level VCSEL/LED Burn-in Handler

Wafer-Level VCSEL/LED Burn-in Handler

It is a full turnkey solution designed to probe & burn-in packages such as VCSEL, LED and LIDAR in wafer-level. This handler is capable of testing up to 7,200 DUTs in one pass with a controlled temperature up to 135°C.

It comes with built-in system such as DI water cooling system,  leakage detector as well as temperature controllers.

Standard Features
– Fully Motorized Mechanism
– Self-Alignment Precision Probing
– Easy Load & Unloading of Substrate Tiles
– Programmable Temperature Profile
– Modular DI Water Cooling System for Easy Maintenance
– User-Defined Burn-in Profile (Continuous/Pulse Mode)
– Designed for Light Detection and Range (LIDAR) Applications

Optional Features
– Remote Accessibility Engineering Data Base
– Pogo Pins Cleaning Capability
– Pogo Pins Life Span Monitoring

Product Specification:
Channels Number Up to 7,200 units
Burn-in Duration Programmable
Probing Pogo Pin Accuracy ±50μm
Electrical Parameters Measurements – Current Source Range: 20mA~100mA/ 0.2A~1.5A
– Current Measurement Tolerance: 0.2mA~±1%
– Compliance Voltage: 24V DC
– Voltage Source Range: 5~24V DC
– Voltage Source Accuracy: 20mV or ±1%
Programmable Temperature Control – Temperature Measuring Control: Ambient~130°C
– Temperature Setting Range: 45°C~130°C
– Temperature Setting Resolution: 0.1°C
– Operation Temperature: 20°C~30°C
– Operation Humidity:<85%RH, Non-Condensing